Patent attributes
A sample analyzer capable of operating in a first measuring mode for measuring a sample and a second measuring mode for measuring a sample, comprising: a sample provider for providing a sample; a common reagent provider for providing a common reagent used in the first measuring mode and the second measuring mode; a special reagent provider for providing a special reagent used in the second measuring mode; a mode selector for selecting one of the first measuring mode and the second measuring mode; a measuring section for measuring the sample; and wherein in the first measuring mode, the sample provider and the common reagent provider operate so as to make a first mode sample comprising the sample and the common reagent, and the measuring section operates so as to measure the first mode sample, and in the second measuring mode, the sample provider, the common reagent provider and the special reagent provider operate so as to make a second mode sample comprising the sample, the common reagent and the special reagent, and the measuring section operates so as to measure the second mode sample, is disclosed. A sample analyzing method is also disclosed.
