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Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
December 22, 2015
0Patent Application Number
133557940
Date Filed
January 23, 2012
0Patent Citations Received
Patent Primary Examiner
Patent abstract
The present invention relates to detecting and/or measuring scattering effects due to the aggregating metallic nanostructures or the interaction of plasmonic emissions from approaching metallic nanoparticles. The scattering effects may be measured at different angles, different wavelengths, changes in absorption and/or changes in polarization relative to changes in the distances between nanoparticles.
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