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US Patent 9147287 Statistical point pattern matching technique

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
0
Date Filed
March 15, 2013
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Date of Patent
September 29, 2015
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Patent Application Number
13844572
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Patent Citations Received
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US Patent 11875413 System and method for property condition analysis
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US Patent 11967097 System and method for change analysis
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US Patent 11915368 Systems and methods for modeling structures using point clouds derived from stereoscopic image pairs
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US Patent 12136127 System and method for property condition analysis
0
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US Patent 11861843 System and method for object analysis
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
9147287
0
Patent Primary Examiner
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Siamak Harandi
0

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