Patent attributes
There is disclosed a method of determining an AM-PM distortion measurement for an amplifier, the method comprising: generating a test waveform to be provided to the input of the amplifier; periodically puncturing the test waveform with a fixed-level reference signal to generate a modified test waveform which alternates between test periods in which a portion of the test waveform is present and reference periods in which the fixed-level reference signal is present; measuring the amplifier AM-PM distortion in a test period; measuring the phase difference between the input and the output of the amplifier in reference periods either side of the test period; estimating a phase error in the test period in dependence on phase differences measured in the reference periods; and estimating the true amplifier AM-PM distortion by removing the estimated phase error from the measured amplifier AM-PM distortion.
