Patent attributes
One embodiment of the present invention relates to a test signal generator configured to generate a single sideband (SSB) test signal that is used for testing components of one or more receiver chains to identify errors in the receiver chains. In one embodiment, the circuit comprises a SSB signal generator configured to generate an IQ baseband signal comprising a sequence of constellation points corresponding to the SSB test signal. The constellation points are modulated onto a high frequency local oscillator signal to generate the SSB test signal, which is inserted into a reception path of a receiver at a test signal injection point. The reception path comprises a mixer configured to mix the SSB test signal with the local oscillator signal to generate a down-converted, intermediate frequency output signal. The output signal may be analyzed to determine errors in the reception path.