US Patent 8912016 Manufacturing method and test method of semiconductor device

Overview Structured Data Issues Contributors Activity

Is a

Patent

Patent attributes

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

8912016

Patent Inventor Names

Hiromichi Godo0

Shuhei Yoshitomi0

Date of Patent

December 16, 2014

Patent Application Number

13162706

Date Filed

June 17, 2011

Patent Citations Received

‌

US Patent 12106661 Determining causation of traffic events and encouraging good driving behavior

‌

US Patent 11840239 Multiple exposure event determination

‌

US Patent 11990036 Driver behavior monitoring

Patent Primary Examiner

‌

Calvin Choi

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