‌

US Patent 8876290 Objective quality metric for ocular wavefront measurements

Patent 8876290 was granted and assigned to WaveTec Vision on November, 2014 by the United States Patent and Trademark Office.

Is a

Current Assignee

Patent Jurisdiction

Patent Number

Patent Inventor Names

Thomas D. Padrick0

Edwin Jay Sarver0

Max Hall0

Date of Patent

November 4, 2014

Patent Application Number

128302210

Date Filed

July 2, 2010

Patent Primary Examiner

No article content yet.

No Timeline data yet.

Title

Author

Link

Type

Date

No Further Resources data yet.

Find more entities like US Patent 8876290 Objective quality metric for ocular wavefront measurements

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.

By using this site, you agree to our Terms of Service.