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US Patent 8679902 Stacked nanowire field effect transistor

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Is a
Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
8679902
Patent Inventor Names
Chun-chen Yeh0
Tenko Yamashita0
Veeraraghavan S. Basker0
Date of Patent
March 25, 2014
Patent Application Number
13628726
Date Filed
September 27, 2012
Patent Citations Received
‌
US Patent 12136656 Semiconductor structure having two-dimensional channel
0
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US Patent 11935930 Wrap-around-contact for 2D-channel gate-all-around field-effect-transistors
0
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US Patent 11990530 Replacement-channel fabrication of III-V nanosheet devices
0
Patent Primary Examiner
‌
Julia Slutsker
Patent abstract

A method for fabricating a nanowire field effect transistor device includes depositing a first sacrificial layer on a substrate, depositing a first layer of a semiconductor material on the first sacrificial layer, depositing a second sacrificial layer on the first layer of semiconductor material, depositing a second layer of the semiconductor material on the second sacrificial layer, pattering and removing portions of the first sacrificial layer, the first semiconductor layer, the second sacrificial layer, and the second semiconductor layer, patterning a dummy gate stack, removing the dummy gate stack, removing portions of the sacrificial layer to define a first nanowire including a portion of the first semiconductor layer and a second nanowire including a portion of the second semiconductor layer, and forming gate stacks about the first nanowire and the second nanowire.

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