‌

US Patent 8542880 System and process for roof measurement using aerial imagery

Patent 8542880 was granted and assigned to Pictometry International Corp. on September, 2013 by the United States Patent and Trademark Office.

Overview Structured Data Issues Contributors

Is a

Patent

Patent attributes

Patent Applicant

‌

Pictometry International Corp.

Current Assignee

‌

Pictometry International Corp.

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

85428800

Date of Patent

September 24, 2013

Patent Application Number

137744780

Date Filed

February 22, 2013

Patent Citations Received

‌

US Patent 12136127 System and method for property condition analysis

‌

US Patent 11915368 Systems and methods for modeling structures using point clouds derived from stereoscopic image pairs

‌

US Patent 11967097 System and method for change analysis

‌

US Patent 11687768 Platform, systems, and methods for identifying characteristics and conditions of property features through imagery analysis

‌

US Patent 11693996 System and method for construction estimation using aerial images

‌

US Patent 11699261 Graphical user interface for controlling a solar ray mapping

‌

US Patent 11783544 Solar ray mapping via divergent beam modeling

...

Patent Primary Examiner

‌

Atiba O Fitzpatrick

No article content yet.

Timeline

No Timeline data yet.

Further Resources

Title

Author

Link

Type

Date

No Further Resources data yet.

References

Find more entities like US Patent 8542880 System and process for roof measurement using aerial imagery

Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.

Open Query Tool

Access by API