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US Patent 8186210 Surface evaluation employing orthogonal force measurement

Patent 8186210 was granted and assigned to Hysitron, Inc. on May, 2012 by the United States Patent and Trademark Office.

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Patent attributes

Current Assignee
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Hysitron, Inc.
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
81862100
Patent Inventor Names
Ude Dirk Hangen0
Date of Patent
May 29, 2012
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Patent Application Number
124710360
Date Filed
May 22, 2009
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Patent Citations Received
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US Patent 11835546 Characterization of nanoindented and scratch induced accoustic events
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US Patent 12071694 Method for manufacturing a component
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Patent Primary Examiner
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Robert R Raevis
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Patent abstract

A method for evaluating a performance of a substrate surface including applying a normal force with a probe to a surface of a substrate, the normal force being substantially perpendicular to the surface, and moving the probe across the surface to generate a force against and to scratch the surface, the force being substantially parallel to the surface and comprising a coaxial force along the scratch and an orthogonal force perpendicular to the scratch. The method further includes measuring a magnitude of the orthogonal force as the probe moves across the coating, and determining a fracture point of the surface by the probe based on changes in the magnitude of the orthogonal force.

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