US Patent 8165350 Assessment of a view through the overlay of maps

A system for evaluating a view, including a first mapper for encoding an image of a view according to a first parameter to create a first map having multiple defined areas, a second mapper for encoding the image according to a second parameter to create a second map having multiple defined areas, an overlap mapper for combining the maps to create an overlap map, a tabulator for measuring areas in the overlap map corresponding to overlapping defined areas, creating a set of measurements of the image, and an analyzer for analyzing the set of measurements of the image and a learning set of measurement groups with associated values to compute an estimated value associated with the image where the estimated value relates to the set of measurements of the image in the same manner that each value in the learning set relates to its associated measurement group.