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US Patent 8115165 Mass selector

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Patent
Patent

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
8115165
Date of Patent
February 14, 2012
Patent Application Number
12788391
Date Filed
May 27, 2010
Patent Citations Received
‌
US Patent 11837452 Charge detection mass spectrometry
3
‌
US Patent 11842891 Ion detector
4
Patent Primary Examiner
‌
Jack Berman
Patent abstract

A mass spectrometer and method for performing high resolution mass spectrometry are provided, the mass spectrometer comprising an electrostatic trap and mass analyzer. The electrostatic trap comprises entrance and exit ends, entrance and exit end ion mirrors, a central field-free region, and a longitudinal axis. The mass analyzer receives ions from the exit end. Ions are admitted into the electrostatic trap via the entrance end, trapping ions in the electrostatic trap, the ions oscillating between the entrance and exit end ion mirrors along the axis. The electrostatic trap waits for the ions to separate into bunches different m/z values via the oscillating, and then excites a given bunch of ions of a given m/z value along the axis until at least a portion of the given bunch overcomes a barrier field at the exit end ion mirror, exiting the electrostatic trap for analysis, leaving behind remaining ions.

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