Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Chris D. Geddes0
Date of Patent
January 24, 2012
Patent Application Number
11917075
Date Filed
June 15, 2006
Patent Citations Received
Patent Primary Examiner
Patent abstract
The present invention relates to detecting and/or measuring scattering effects due to the aggregating metallic nanostructures or the interaction of plasmonic emissions from approaching metallic nanoparticles. The scattering effects may be measured at different angles, different wavelengths, changes in absorption and/or changes in polarization relative to changes in the distances between nanoparticles.
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