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US Patent 8000519 Method of metal pattern inspection verification

Patent 8000519 was granted and assigned to Xilinx on August, 2011 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
Xilinx
Xilinx
Date Filed
April 4, 2007
Date of Patent
August 16, 2011
Patent Application Number
11732859
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
8000519
Patent Primary Examiner
‌
Matthew Bella

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