Is a
Patent attributes
Current Assignee
0
Patent Jurisdiction
Patent Number
Patent Inventor Names
Yuan-Li Ding0
Xiao-Fei Han0
Xing-Hua Zhang0
Xu Ma0
Chih-Ping Lee0
Da-Jiang Yang0
Hong Liao0
Hong Ma0
...
Date of Patent
August 2, 2011
0Patent Application Number
123976620
Date Filed
March 4, 2009
0Patent Primary Examiner
Patent abstract
A test pattern structure including a first conductive layer and a second conductive layer is provided. The second conductive layer is directly disposed on the first conductive layer and connected to the first conductive layer through a plurality of connection interfaces. The test pattern structure of the present invention can detect the interconnection failure quickly and correctly without SEM identification.
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