US Patent 7985952 Charged particle spin polarimeter, microscope, and photoelectron spectroscope
Patent 7985952 was granted and assigned to Hitachi on July, 2011 by the United States Patent and Trademark Office.
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A charged particle spin polarimeter that is capable of resolving with high efficiency the magnetic moment of a charged particle. The charged particle spin polarimeter has a pair of convex and concave magnetic poles to apply a magnetic field with gradient to an incident charged particle and a pair of plain plate electrodes to apply, to a charged particle, an electric field for canceling a Lorentz force that the charged particle receives from the magnetic field. The magnetic moment in the magnetic field direction of a charged particle is resolved by the interaction between the gradient of the magnetic field and the magnetic moment of the charged particle.
US Patent 07985952 Charged particle spin polarimeter, microscope, and photoelectron spectroscope US Patent 7985952 Charged particle spin polarimeter, microscope, and photoelectron spectroscope
US Patent 07985952 Charged particle spin polarimeter, microscope, and photoelectron spectroscope
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