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US Patent 7964107 Methods using block copolymer self-assembly for sub-lithographic patterning

Patent 7964107 was granted and assigned to Micron Technology on June, 2011 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Current Assignee
Micron Technology
Micron Technology
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
79641071
Patent Inventor Names
Dan B. Millward1
Date of Patent
June 21, 2011
1
Patent Application Number
117039111
Date Filed
February 8, 2007
1
Patent Primary Examiner
‌
Anita K Alanko
1
Patent abstract

Block copolymers can be self-assembled and used in methods as described herein for sub-lithographic patterning, for example. The block copolymers can be diblock copolymers, triblock copolymers, multiblock copolymers, or combinations thereof. Such methods can be useful for making devices that include, for example, sub-lithographic conductive lines.

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