Patent attributes
The sensing apparatus includes a measuring light emission device, a waveguide member including a sensing surface modified by a surface modification substance, a detection device and an analyzer. The measuring light of a predetermined polarized state is emitted from the emission device so that the measuring light is totally reflected on the sensing surface of the waveguide member holding target substances labeled by fine metal particles to illuminate the particles by evanescent light generated near the sensing surface. The amount of evanescent light scattered by the fine metal particles is detected by the detection device. The measuring light emission device, the waveguide member and the analyzer are included in an optical waveguide system which sets a polarized state of scattered light generated when no target substance is present on the sensing surface in a crossed nicol relation to the analyzer.
