US Patent 7944059 Semiconductor device having a probing region

Patent 7944059 was granted and assigned to Panasonic on May, 2011 by the United States Patent and Trademark Office.

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Is a

Patent

Patent attributes

Current Assignee

Panasonic

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

79440590

Patent Inventor Names

Noriyuki Nagai0

Toshihiko Sakashita0

Date of Patent

May 17, 2011

Patent Application Number

114947050

Date Filed

July 28, 2006

Patent Primary Examiner

‌

Shouxiang Hu

Patent abstract

In a semiconductor device, a pad metal has at least a portion located immediately under a probe region, and the portion is divided into a plurality of narrow metal layers each arranged in parallel with a traveling direction of a probe. Thus, it is possible to enhance surface flatness of the pad metal and to prevent a characteristic of a semiconductor device from deteriorating without complication in processing and increase in chip size.