US Patent 7898274 Structure of probe
Patent 7898274 was granted and assigned to Nanya Technology Corporation on March, 2011 by the United States Patent and Trademark Office.
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A split-type probe is used to contact with an object under test to detect an electrical characteristic thereof. The probe provided by the present invention has a contact head used to contact with the object under test, and a first needle body and a second needle body. The first needle body is connected to the contact head to transmit a testing signal to the object under test for performing detection. In addition, the second needle body is also connected to the contact head to transmit a response signal generated by the object under test due to the testing signal to obtain the electrical characteristic of the object under test.
US Patent 07898274 Structure of probe US Patent 7898274 Structure of probe
US Patent 07898274 Structure of probe
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