US Patent 7869293 Memory sense scan circuit and test interface
Patent 7869293 was granted and assigned to Advanced Micro Devices on January, 2011 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
September 28, 2007
1
Date of Patent
January 11, 2011
1
Patent Application Number
11863972
1
Patent Inventor Names
Stephen L. Morein
1
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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