Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Kwang-Jin Lee0
Beak-Hyung Cho0
Chang-Soo Lee0
Hyung-Rok Oh0
Date of Patent
January 11, 2011
0Patent Application Number
127875710
Date Filed
May 26, 2010
0Patent Primary Examiner
Patent abstract
A method of testing PRAM devices is disclosed. The method simultaneously writes input data to a plurality of memory banks by writing set data to a first group of memory banks and writing reset data to a second group of memory banks, performs a write operation test by comparing data read from the plurality of memory banks with corresponding input data, and determines a fail cell in relation to the test results.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.