Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Mei-Mei Su0
Phillip D. Burlison0
John K. Frediani0
Date of Patent
January 4, 2011
Patent Application Number
11941026
Date Filed
November 15, 2007
Patent Primary Examiner
Patent abstract
A failure mask memory is added to a semiconductor tester. In conjunction with a new failure filter, failures may be ignored or used to update the contents of failure mask memory. Only the first instance of a failure is reported reducing the size of test data logs.
Timeline
No Timeline data yet.
Further Resources
No Further Resources data yet.
