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US Patent 7848106 Temperature control within disk drive testing systems

Patent 7848106 was granted and assigned to Teradyne on December, 2010 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
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Current Assignee
Teradyne
Teradyne
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Date Filed
April 17, 2008
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Date of Patent
December 7, 2010
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Patent Application Number
12105061
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Patent Citations Received
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US Patent 12007411 Test socket having an automated lid
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US Patent 11852678 Multi-input multi-zone thermal control for device testing
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US Patent 11867749 Vision system for an automated test system
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US Patent 11940487 Thermal solution for massively parallel testing
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US Patent 11953519 Modular automated test system
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US Patent 11754596 Test site configuration in an automated test system
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US Patent 11754620 DUT placement and handling for active thermal interposer device
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US Patent 11754622 Thermal control system for an automated test system
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US Patent 11774492 Test system including active thermal interposer device
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US Patent 11835549 Thermal array with gimbal features and enhanced thermal performance
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•••
Patent Inventor Names
Brian S. Merrow
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
7848106
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Patent Primary Examiner
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Michael V. Datskovskiy
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