Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Junji Miura0
Takahisa Nakano0
Date of Patent
November 23, 2010
0Patent Application Number
117142250
Date Filed
March 6, 2007
0Patent Primary Examiner
Patent abstract
An inspection apparatus includes a light source unit which irradiates illumination light onto a hologram of a medium from a predetermined direction at which diffraction light from the hologram is obtained, a first light receiving member which receives the diffraction light from the hologram, a second light receiving member which receives transmitted part of illumination light irradiated onto the hologram, having passed through the medium, and an identification processing unit which identifies authenticity of the hologram from the diffraction light received by the first light receiving member and identifies a defect of the hologram from the transmitted light received by the second light receiving member.
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