Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Phil C. Yeh0
Jane H. Bartik0
Lisa Cranton Heller0
Patrick M. West, Jr.0
Damian L. Osisek0
Donald W. Schmidt0
Date of Patent
November 2, 2010
0Patent Application Number
122443000
Date Filed
October 2, 2008
0Patent Primary Examiner
Patent abstract
A measurement sampling facility takes snapshots of the central processing unit (CPU) on which it is executing at specified sampling intervals to collect data relating to tasks executing on the CPU. The collected data is stored in a buffer, and at selected times, an interrupt is provided to remove data from the buffer to enable reuse thereof. The interrupt is not taken after each sample, but in sufficient time to remove the data and minimize data loss.
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