Patent 7827209 was granted and assigned to Tektronix on November, 2010 by the United States Patent and Trademark Office.
A test and measurement instrument and method of operating for presenting data in a data presentation, receiving a data selection indicating a portion of the data presented in the data presentation, generating a data object in response to the data selection, presenting the data object in an analysis sandbox, and generating an analysis construct in response to analysis objects in the analysis sandbox.