US Patent 7808262 Integrated systems testing

A method of making and testing a system on chip (SOC) comprises providing an integrated system test (IST) module in each one of a plurality of SOC components. At least one of the SOC components communicates with an external interface and at least one other of the SOC components. The method includes receiving test configuration data, transmitting test result data, and transmitting and receiving application data via the external interface. The method includes using at least one of the IST modules to receive the test configuration data and configure the IST modules to test the plurality of SOC components.