US Patent 7773011 Self-testing digital-to-analog converter

Patent 7773011 was granted and assigned to Texas Instruments on August, 2010 by the United States Patent and Trademark Office.

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Patent abstract

One embodiment of the invention includes a digital-to-analog converter (DAC) circuit. The DAC circuit includes a DAC portion configured to generate an output voltage having a magnitude that varies based on a plurality of digital values of a digital input signal. The DAC circuit also includes a test portion configured to compare the output voltage with a predetermined test voltage for each of the plurality of digital values of the digital input signal during a test mode. The test portion can provide a digital output signal corresponding to one of acceptance and failure of the DAC circuit.

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Patent Inventor Names

Biranchinath Sahu0

Christopher Sanzo0

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