US Patent 7770232 Scanning probe microscope system
Patent 7770232 was granted and assigned to Riken on August, 2010 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
March 16, 2006
0
Date of Patent
August 3, 2010
0
Patent Application Number
11887276
0
Patent Citations Received
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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