Patent attributes
The present invention relates to a micro total analysis system comprising a spectroscope and a method of manufacturing such a system comprising a spectroscope in a one step process. More over the invention relates to a method of analyzing a sample in the system. The micro total analysis system comprising a spectroscope provided on a substrate and for measuring electromagnetic radiation and at least one microfluidic channel. The spectroscope comprises: a slab waveguide for guiding electromagnetic waves towards a diffraction grating dispersing the electromagnetic waves into their component wavelengths, and output means for receiving the deflected electromagnetic waves. At least a part of the microfluidic channel, the slab waveguide and the grating comprises the same main material, such as a polymer material.