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US Patent 7761966 Method for repairing a microelectromechanical system

Patent 7761966 was granted and assigned to Touchdown Technologies on July, 2010 by the United States Patent and Trademark Office.

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edited on 31 Oct, 2023
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Patent abstract

A method for repairing a damaged probe from a probe card comprising the steps of removing the damaged probe from the probe card, separating one a plurality of replacement probes from a substrate and installing the one probe separated from the plurality of replacement probes where the damaged probe was removed.

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Patent Inventor Names
Lakshmikanth Namburi0
Raffi Garabedian0
Edits on 21 Jul, 2023
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Official Website
https://pdfpiw.uspto.gov/.piw?Docid=077619660
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US Patent 07761966 Method for repairing a microelectromechanical system US Patent 7761966 Method for repairing a microelectromechanical system

Infobox
Patent Number
077619660
Patent Number
77619660
Edits on 23 Sep, 2022
"Entity importer update"
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edited on 23 Sep, 2022
Infobox
Is a
Patent
Patent
0
Current Assignee
‌
Touchdown Technologies
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
077619660
Date of Patent
July 27, 2010
0
Patent Application Number
117782070
Date Filed
July 16, 2007
0
Official Website
https://pdfpiw.uspto.gov/.piw?Docid=077619660
Patent Primary Examiner
‌
C. J. Arbes
0
Edits on 3 Jun, 2022
"Entity importer update"
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edited on 3 Jun, 2022
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Infobox (+1 properties)
Infobox
Website URL
https://pdfpiw.uspto.gov/.piw?Docid=07761966
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"Created via: Entity Importer"
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created this topic on 5 Dec, 2021
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 US Patent 07761966 Method for repairing a microelectromechanical system

Infobox
Is a
Patent
Patent
Current assignee
‌
Touchdown Technologies
Patent jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent number
07761966
Date of patent
July 27, 2010
Patent application number
11778207
Date Filed
July 16, 2007
Patent primary examiner
‌
C. J. Arbes

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