Patent 7757143 was granted and assigned to Mitsumi Electric on July, 2010 by the United States Patent and Trademark Office.
A semiconductor device includes one or more test terminals and a test control circuit is disclosed. The test control circuit tests an internal circuit according to the signals received from the one or more test terminals. Afterwards, specification information held in a specification information holding unit is renewed such that one or more inputs of the test control circuit are fixed to a predetermined level.