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US Patent 7755162 Anti-fuse memory cell

Patent 7755162 was granted and assigned to Sidense on July, 2010 by the United States Patent and Trademark Office.

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Patent
Patent

Patent attributes

Current Assignee
‌
Sidense
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7755162
Patent Inventor Names
Wlodek Kurjanowicz0
Steven Smith0
Date of Patent
July 13, 2010
Patent Application Number
11762552
Date Filed
June 13, 2007
Patent Primary Examiner
‌
Hoai V Pham
Patent abstract

An anti-fuse memory cell having a variable thickness gate oxide. The variable thickness gate oxide has a thick gate oxide portion and a thin gate oxide portion, where the thing gate oxide portion has at least one dimension less than a minimum feature size of a process technology. The thin gate oxide can be rectangular in shape or triangular in shape. The anti-fuse transistor can be used in a two-transistor memory cell having an access transistor with a gate oxide substantially identical in thickness to the thick gate oxide of the variable thickness gate oxide of the anti-fuse transistor.

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