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Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Date of Patent
July 13, 2010
Patent Application Number
12216561
Date Filed
July 8, 2008
Patent Primary Examiner
Patent abstract
This invention proposes a method for making very low threshold voltage (Vt) metal-gate/high-κ CMOSFETs using novel self-aligned low-temperature ultra shallow junctions with gate-first process compatible with VLSI. At 1.2 nm equivalent-oxide thickness (EOT), good effective work-function of 5.3 and 4.1 eV, low Vt of +0.05 and 0.03 V, high mobility of 90 and 243 cm2/Vs, and small 85° C. bias-temperature-instability <32 mV (10 MV/cm, 1 hr) are measured for p- and n-MOS.
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