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US Patent 7751891 Power supply monitoring for an implantable device

Patent 7751891 was granted and assigned to Cyberonics on July, 2010 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent
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Patent attributes

Current Assignee
Cyberonics
Cyberonics
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
77518910
Patent Inventor Names
Albert W. Guzman0
Huan D. Nguyen0
Randolph K. Armstrong0
Date of Patent
July 6, 2010
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Patent Application Number
109022210
Date Filed
July 28, 2004
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Patent Citations Received
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US Patent 11890471 Vagus nerve stimulation pre-screening test
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US Patent 12121726 Control of vagal stimulation
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US Patent 11969253 Closed-loop vagus nerve stimulation
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US Patent 11964150 Batteryless implantable microstimulators
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US Patent 11857788 Methods and apparatuses for reducing bleeding via coordinated trigeminal and vagal nerve stimulation
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US Patent 11938324 Systems and methods for vagus nerve stimulation
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Patent Primary Examiner
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George R Evanisko
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Patent abstract

A method and an apparatus for projecting an end of service (EOS) and/or an elective replacement indication (ERI) of a component in an implantable device and for determining an impedance experienced by a lead associated with the implantable device. An active charge depletion of an implantable device is determined. An inactive charge depletion of the implantable device is determined. A time period until an end of service (EOS) and/or elective replacement indication (ERI) of a power supply associated with the IMD based upon the active charge depletion, the inactive charge depletion, and the initial and final (EOS) battery charges, is determined. Furthermore, to determine the impedance described above, a substantially constant current signal is provided through a first terminal and a second terminal of the lead. A voltage across the first and second terminals is measured. An impedance across the first and second terminals is determined based upon the constant current signal and the measured voltage.

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