Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Sang Man Bae0
Date of Patent
June 15, 2010
Patent Application Number
11944746
Date Filed
November 26, 2007
Patent Primary Examiner
Patent abstract
To overcome the limitations to development of photosensitive layers in a lithography process using a light source such as KrF, ArF, VUV, EUV, E-beam, ion beam, etc., and a patterning process of a large circuit board or a bending substrate, the invention provides a method for manufacturing a semiconductor device in which the photosensitive layer comprises a thermal acid generator that is reacted with heat to form an acid, and a masking process in a lithography process using a light source is performed as a heat conduction process using a thermally conductive pattern so that a patterning process is performed easily without limiting the size and shape of a semiconductor substrate.
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