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US Patent 7702643 System and method for metamodel-based gap analysis

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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7702643
Date of Patent
April 20, 2010
Patent Application Number
11649430
Date Filed
January 4, 2007
Patent Primary Examiner
‌
Uyen T Le
Patent abstract

A system and methods for comparing differences and similarities of at least two models including generating corresponding metamodel maps, visual representation of the models, and conducting a series of phases of comparison of the models using a mapping index, wherein the mapping index includes the metamodel maps and the visual representation of the models to produce a comparison output.

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