US Patent 7698610 Techniques for detecting open integrated circuit pins

Patent 7698610 was granted and assigned to Freescale Semiconductor on April, 2010 by the United States Patent and Trademark Office.

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Is a

Patent

Patent attributes

Current Assignee

Freescale Semiconductor

Patent Jurisdiction

United States Patent and Trademark Office

Patent Number

7698610

Date of Patent

April 13, 2010

Patent Application Number

11828023

Date Filed

July 25, 2007

Patent Primary Examiner

‌

James C. Kerveros

Patent abstract

A technique of detecting an open integrated circuit (IC) pin includes selectively coupling a first open detect circuit, which includes a first inverter having a first threshold, to the IC pin. Next, a first logic state at an output of the first inverter is determined. Then, based upon the first logic state, it is determined whether the IC pin is open or whether it is indeterminate as to whether the IC pin is open. When it is indeterminate as to whether the IC pin is open, based on the first logic state, a second open detect circuit is selectively coupled to the IC pin. The second open detect circuit includes a second inverter having a second threshold (the first threshold is greater than the second threshold). A second logic state at an output of the second inverter is then determined. Finally, based upon the first and second logic states, it is determined whether the IC pin is open.