Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
John Y. S. Kim0
Young J. Son0
Date of Patent
March 16, 2010
0Patent Application Number
123902190
Date Filed
February 20, 2009
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A method and apparatus are provided for measuring the depth of a hole with a first edge and a second edge, comprising positioning a distal end of a first member of a measuring instrument against a first surface in which the first edge is formed. Then, positioning a distal end of a second member against a second surface in which the second edge is formed, the first member and the second member being movably connected; and finally, measuring an electronic signal that represents the distance between the first member and the second member.
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