Is a
Patent attributes
Patent Jurisdiction
Patent Number
Patent Inventor Names
Curtis Lee Carrender0
Mark A. Hadley0
Date of Patent
February 9, 2010
0Patent Application Number
120229330
Date Filed
January 30, 2008
0Patent Citations Received
Patent Primary Examiner
Patent abstract
A method and apparatus for testing RFID straps. Arrays of RFID straps in a roll-to-roll process are coupled to an array of test elements. RF programming and interrogation signals are frequency and time multiplexed to the RFID array. Return signals are detected to determine sensitivity and programmability parameters of the RFID straps.
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