US Patent 7644329 Integrated circuit testing method and related circuit thereof
Patent 7644329 was granted and assigned to ALi Corporation on January, 2010 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
September 11, 2007
0
Date of Patent
January 5, 2010
0
Patent Application Number
11853023
0
Patent Inventor Names
Chung-Hsin Chiang
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
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