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US Patent 7644329 Integrated circuit testing method and related circuit thereof

Patent 7644329 was granted and assigned to ALi Corporation on January, 2010 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Current Assignee
ALi Corporation
ALi Corporation
1
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
1
Patent Number
76443291
Patent Inventor Names
Chung-Hsin Chiang1
Date of Patent
January 5, 2010
1
Patent Application Number
118530231
Date Filed
September 11, 2007
1
Patent Primary Examiner
‌
James C. Kerveros
1
Patent abstract

A chip with an integrated circuit testing function includes a selecting unit positioned before a flip-flop of a scan chain, where the scan chain connects a scan-in pad, a scan-out pad and the flip-flop. When the chip is packaged and the scan-in pad does not connect to a pin of a package, the selecting unit selects a scan-in signal from another scan chain and transmits the scan-in signal from the another scan chain to the flip-flop; and when the chip is packaged and the scan-in pad connects to a pin of the package, the selecting unit selects a scan-in signal from the scan-in pad and transmits the scan-in signal from the scan-in pad to the flip-flop.

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