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US Patent 7619746 Generating model signals for interferometry

Patent 7619746 was granted and assigned to Zygo Corporation on November, 2009 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Current Assignee
Zygo Corporation
Zygo Corporation
Date Filed
July 19, 2007
Date of Patent
November 17, 2009
Patent Application Number
11780360
Patent Citations Received
‌
US Patent 11802837 Methods and systems for coherent imaging and feedback control for modification of materials via imaging a feedstock supply stream interferometrically
‌
US Patent 11681030 Range calibration of light detectors
0
‌
US Patent 11747453 Calibration system for light detection and ranging (lidar) devices
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7619746
Patent Primary Examiner
‌
Michael A Lyons

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