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US Patent 7616802 Light reflection intensity calculation circuit

Patent 7616802 was granted and assigned to Digital Media Professionals Inc. on November, 2009 by the United States Patent and Trademark Office.

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Patent attributes

Current Assignee
Digital Media Professionals Inc.
Digital Media Professionals Inc.
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7616802
Patent Inventor Names
Eiju Tsuboi1
Tsuneo Ikedo1
Date of Patent
November 10, 2009
Patent Application Number
10547678
Date Filed
March 5, 2004
Patent Primary Examiner
‌
Bhavesh M. Mehta
Patent abstract

A circuit for calculating a light reflected component with high accuracy. The circuit for calculating a reflected component of light reflected from an object having a rough surface comprises a means for storing the reflectance of an object in relation to the value φ or the value of cos φ, letting a surface normal vector be denoted by a vector N, a light source incidence unit vector be denoted by a vector L, a line-of-sight unit vector be denoted by V, a half vector of the light source incidence vector L and the line-of-sight vector V be denoted by H and defining the inner products as N·L=cos θ, N·V=cos γ, V·H=cos φ, N·H=cos β; a means for storing a luminance distribution in relation to the value of β or the value of cos β; a means for acquiring information on the reflectance term (Fλ(φ)) of the reflected component according to the value of φ or the value of cos φ from the reflectance storing means; a means for acquiring information on the luminance distribution term (D′(β)) of the reflected component according to the value of β or the value of cos β from the luminance distribution storing means; a means for acquiring information on max[0.5 cos θ cos φ, 0.5 cos φ cos γ, cos θ cos β cos γ] which is the maximum value out of 0.5 cos θ cos φ, 0.5 cos φ cos γ, cos θ cos β cos γ; a means for determining the reciprocal of the max[0.5 cos θ cos φ, 0.5 cos φ cos γ, cos θ cos β cos γ] and acquiring information on the geometrical attenuation factor term G′(β, θ, γ, φ) of the reflected component; and a means for acquiring information on the reflected component from the information on the luminance distribution term (D′(β)) and information on the geometrical attenuation factor term G′(β, θ, γ, φ).

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