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US Patent 7602501 Interferometric synthetic aperture microscopy

OverviewStructured DataIssuesContributorsActivity
Is a
Patent
Patent
Date Filed
July 10, 2007
Date of Patent
October 13, 2009
Patent Application Number
11775572
Patent Citations Received
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US Patent 11890052 Frequency-domain interferometric based imaging systems and methods
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US Patent 11690540 Systems, methods, and apparatus for differential phase contrast microscopy by transobjective differential EPI-detection of forward scattered light
0
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US Patent 11835734 Illumination apparatus optimized for synthetic aperture optics imaging using minimum selective excitation patterns
0
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US Patent 11841495 Method for detecting particles using structured illumination
0
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7602501
Patent Primary Examiner
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Tarifur Chowdhury

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