Is a
Patent attributes
Current Assignee
Patent Jurisdiction
Patent Number
Patent Inventor Names
Asher Peled0
David Berman0
Alexander Krokhmal0
Boris Yokhin0
Date of Patent
October 13, 2009
Patent Application Number
11892005
Date Filed
August 17, 2007
Patent Citations Received
Patent Primary Examiner
Patent abstract
A method for X-ray analysis of a sample includes directing a beam of X-rays to impinge on a structure in the sample such that the X-rays are scattered from the structure in a pattern of stripes, and receiving the scattered X-rays using an array of detectors. A relative alignment between the sample and the array is adjusted so that the stripes are parallel to the detectors.
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