US Patent 7599052 Method for marking defect and device therefor
Patent 7599052 was granted and assigned to NKK on October, 2009 by the United States Patent and Trademark Office.
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Patent abstract
A defect marking device includes a flaw inspection device which has a plurality of light-receiving parts that identify reflected lights coming from an inspection plane of a metal strip under two or more of optical conditions different from each other; a signal processing section that judges the presence/absence of surface flaw on the inspection plane based on a combination of reflected light components identified under these optical conditions different from each other; and a marking device which applies marking that indicates information relating to the flaw on the surface of the metal strip.
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US Patent 07599052 Method for marking defect and device therefor US Patent 7599052 Method for marking defect and device therefor
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Patent Number
0759905200
Patent Number
759905200
Edits on 19 May, 2023
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Official Website
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Infobox
Is a
Current Assignee
0
Patent Jurisdiction
Patent Number
075990520
Date of Patent
October 6, 2009
0Patent Application Number
122284780
Date Filed
August 13, 2008
0Official Website
Patent Primary Examiner
Edits on 24 Sep, 2022
Golden AI
Infobox
Is a
Current Assignee
0
Patent Jurisdiction
Patent Number
075990520
Date of Patent
October 6, 2009
0Patent Application Number
122284780
Date Filed
August 13, 2008
0Official Website
Patent Primary Examiner
Edits on 18 Jun, 2022
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US Patent 07599052 Method for marking defect and device therefor
Infobox
Is a
Current assignee
Patent jurisdiction
Patent number
07599052
Date of patent
October 6, 2009
Patent application number
12228478
Date Filed
August 13, 2008
Patent primary examiner
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