US Patent 7555340 Electrogram morphology-based CRT optimization
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Patent Inventor Names
Douglas R. Daum0
Jiang Ding0
Scott A. Meyer0
Yanting Dong0
Yinghong Yu0
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Patent abstract
A method and system for determining an optimum atrioventricular delay (AVD) interval and/or ventriculo-ventricular delay (VVD) intervals for delivering ventricular resynchronization pacing in an atrial tracking or atrial sequential pacing mode. Evoked response electrograms recorded at different AVD and VVD intervals are used to determine the extent of paced and intrinsic activation.
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US Patent 07555340 Electrogram morphology-based CRT optimization US Patent 7555340 Electrogram morphology-based CRT optimization
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Patent Number
075553400
Patent Number
75553400
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Patent Jurisdiction
Patent Number
075553400
Date of Patent
June 30, 2009
0Patent Application Number
110974600
Date Filed
April 1, 2005
0Official Website
Patent Primary Examiner
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US Patent 07555340 Electrogram morphology-based CRT optimization
Infobox
Is a
Patent jurisdiction
Patent number
07555340
Date of patent
June 30, 2009
Patent application number
11097460
Date Filed
April 1, 2005
Patent primary examiner
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