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US Patent 7542856 Structure monitor system

Patent 7542856 was granted and assigned to Neubrex Co., Ltd. on June, 2009 by the United States Patent and Trademark Office.

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Current Assignee
Neubrex Co., Ltd.
Neubrex Co., Ltd.
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
7542856
Patent Inventor Names
Kinzo Kishida0
Motohiro Nakano0
Yoshiaki Yamauchi0
Date of Patent
June 2, 2009
Patent Application Number
10562922
Date Filed
July 2, 2003
Patent Citations Received
‌
US Patent 11891897 Integrated manufacturing system and method for small-deformation self-diagnosis shield segment
0
Patent Primary Examiner
‌
Michael P Nghiem
Patent abstract

A structure monitor system comprising a measuring unit 3 for measuring distortions of the structure S at respective points on a boundary by using an optical fiber sensor 2 laid on the boundary of the structure, numerical analysis unit 5 for calculating a distortion at a specified point on the structure S by a numerical analysis method with distortions measured by the measuring unit as a boundary condition, and a display unit 6 for displaying information on an analysis distortion by the numerical analysis unit 5 in a association with a position on the structure S.

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